Shanghai, China

Xiaohua Ju

This inventor holds 2 USPTO granted patents. Top assignee: Shanghai Huali Microelectronics Corporation. Active years: 2021.


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2021

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2 patents (USPTO):Explore Patents

Title: Innovations of Xiaohua Ju in NAND Memory Technology

Introduction

Xiaohua Ju is a prominent inventor based in Shanghai, China. He has made significant contributions to the field of NAND memory technology, holding a total of 2 patents. His work focuses on improving the fabrication processes and optimizing critical dimensions in NAND flash memory.

Latest Patents

Xiaohua Ju's latest patents include a method for fabricating word lines of NAND memory and a method for optimizing a critical dimension for double patterning for NAND flash. The first patent describes a process that enhances the uniformity of etched word lines by strategically adding a sacrificial pattern. This innovation ensures that the morphology and size of the edge word lines are more consistent with those in the middle area during the etching process. The second patent provides a method for optimizing critical dimensions by controlling the morphology and etching rates, ultimately improving product yield.

Career Highlights

Xiaohua Ju is currently employed at Shanghai Huali Microelectronics Corporation, where he continues to advance his research in semiconductor technology. His expertise in NAND memory fabrication has positioned him as a key player in the industry.

Collaborations

Xiaohua has collaborated with notable colleagues, including Guanqun Huang and Li He, who contribute to the innovative environment at Shanghai Huali Microelectronics Corporation.

Conclusion

Xiaohua Ju's contributions to NAND memory technology through his patents reflect his commitment to innovation and excellence in the field. His work not only enhances the performance of NAND memory but also sets a foundation for future advancements in semiconductor technology.

Profile summary based on public USPTO records.
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