Taoyuan, Taiwan

Wun-Ye Ku

This inventor holds 5 USPTO granted patents. Top assignee: Nan Ya Technology Corporation. Active years: 2022-2025.


% Patents Active = 100.0

Average Co-Inventor Count = 3.5

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2022-2025

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5 patents (USPTO):Explore Patents

Title: Wun-Ye Ku: Innovator in Electronic Systems

Introduction

Wun-Ye Ku is a notable inventor based in Taoyuan, Taiwan. He has made significant contributions to the field of electronic systems, particularly in the area of defect identification and wafer inspection methods. With a total of 5 patents to his name, his work continues to influence advancements in technology.

Latest Patents

One of Wun-Ye Ku's latest patents is the "Electronic system of specimen qualification." This invention provides an electronic system with a defect identification function and a method for qualifying a photoresist pattern formed using a lithography process. The system includes an inspection apparatus and a processor that applies machine learning processes through neural networks to identify defects in the photoresist pattern. Another significant patent is the "Wafer inspection system method," which outlines a method for identifying candidate regions on a wafer image, generating confidence scores, and determining the presence of probe marks.

Career Highlights

Wun-Ye Ku is currently employed at Nan Ya Technology Corporation, where he continues to innovate and develop new technologies. His work has been instrumental in enhancing the efficiency and accuracy of electronic systems.

Collaborations

Wun-Ye Ku collaborates with talented individuals such as Chia-Lin Tsai and Hung-Chih Chang, contributing to a dynamic work environment that fosters innovation.

Conclusion

Wun-Ye Ku's contributions to electronic systems and his innovative patents highlight his role as a leading inventor in the field. His work not only advances technology but also sets a foundation for future developments in electronic systems.

Profile summary based on public USPTO records.
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