Wolfram Steurer

Title: Wolfram Steurer: Inventor in Noncontact Atomic Force Microscopy

Introduction

Wolfram Steurer is an inventor based in Adliswil, Switzerland, whose patent work concerns measuring local contact potential differences using noncontact atomic force microscopy. His listed portfolio includes 2 patents, and he is associated with International Business Machines Corporation.

Latest Patents

Steurer’s listed patents describe methods for determining a sample’s local contact potential difference with an oscillating cantilever positioned above its surface. Both approaches use two distinct DC voltage values applied between the cantilever and the sample, then derive a local contact potential difference from those values.

One method determines the voltage values for one or more cantilever positions and uses one or more processors to calculate the result. The other describes performing two atomic force microscopy measurements to determine the voltage values. It also notes that substantially similar voltage values indicate substantially similar cantilever-oscillation frequency shifts.

Career Highlights

Steurer’s patent activity reflects work at the intersection of microscopy and electrical measurement. The methods focus on extracting local potential information without requiring contact between the cantilever and the sample.

Collaborations

Steurer’s listed coworkers include Leo Gross and Gerhard Meyer. His work is associated with International Business Machines Corporation.

Conclusion

Wolfram Steurer’s listed inventions address a specific measurement challenge in noncontact atomic force microscopy by using distinct applied voltages to determine local contact potential differences.