This inventor holds 4 USPTO granted patents and 1 EPO patent. Top assignees: Carl-Zeiss-Smt Ag, Optische Systeme Gottingen Isco-Optic Gmbh, Other. Active years: 2004-2009.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2004-2009
Title: Innovations of Wolfgang Reinecke
Introduction
Wolfgang Reinecke is a notable inventor based in Zeuthen, Germany. He has made significant contributions to the field of microscopy, particularly with his innovative designs and technologies. With a total of four patents to his name, Reinecke has established himself as a key figure in advancing optical inspection systems.
Latest Patents
One of his latest patents is the Reflective X-ray microscope and inspection system for examining objects with wavelengths less than 100 nm. This advanced microscope includes a first subsystem with two mirrors and a second subsystem with a third mirror, all designed to illuminate an object with radiation under 100 nm wavelength. The system projects the object with magnification into an image plane, enhancing the capabilities of X-ray microscopy. Another notable patent is a lens assembly comprising nine lenses, which features specific angles and dimensions to optimize optical performance.
Career Highlights
Throughout his career, Wolfgang Reinecke has worked with prominent companies, including Carl Zeiss SMT AG. His work has focused on developing cutting-edge technologies that push the boundaries of what is possible in microscopy and imaging.
Collaborations
Reinecke has collaborated with esteemed colleagues such as Horst Linge and Hans-Jürgen Mann. These partnerships have contributed to the successful development of his innovative projects and patents.
Conclusion
Wolfgang Reinecke's contributions to the field of microscopy through his patents and collaborations highlight his role as a leading inventor. His work continues to influence advancements in optical inspection systems and microscopy technologies.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile