Taipei, Taiwan

Win-Harn Liu

This inventor holds 23 USPTO granted patents and 1 published patent application, primarily in Data Testing Systems. Top assignee: Inventec Corp.. Active years: 2006-2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Win-Harn Liu. Retrieved from https://idiyas.com/inventor/win-harn-liu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 23 

% Patents Active = 30.4

Average Co-Inventor Count = 3.6

ph-index = 3

Forward Citations = 51(Granted Patents)


Company Filing History:


Years Active: 2006-2012

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Areas of Expertise:
Sound Card Testing
Memory Allocation
File Data Restoration
Data Synchronization
Network Card Testing
Intrusion Detection
Virtual Disk Services
Stress Testing
SAS Channel Testing
Communication Path Selection
Peripheral Component Interconnect
Multithread Testing
23 patents (USPTO):Explore Patents

Title: The Innovative Journey of Win-Harn Liu

Introduction: Win-Harn Liu, a distinguished inventor hailing from Taipei, Taiwan, has made significant contributions to the field of technology through his groundbreaking innovations.

Latest Patents: Win-Harn Liu holds several patents in various technological domains, showcasing his continuous commitment to pushing the boundaries of innovation.

Career Highlights: Throughout his illustrious career, Win-Harn Liu has been recognized for his pioneering work in developing cutting-edge technologies that have revolutionized industries worldwide.

Collaborations: Win-Harn Liu has collaborated with leading tech companies, research institutions, and universities, fostering a culture of innovation and knowledge sharing within the industry.

Conclusion: Win-Harn Liu's relentless passion for innovation and his remarkable contributions to the technological landscape have solidified his position as a visionary inventor shaping the future of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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