The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 2010
Filed:
Oct. 24, 2007
Tao Liu, Tianjin, CN;
Qiu-yue Duan, Tianjin, CN;
Tom Chen, Taipei, TW;
Win-harn Liu, Taipei, TW;
Inventec Corporation, Taipei, TW;
Abstract
A stress testing method of a file system includes traversing local or network storage devices with a drive letter; detecting a network mapping path of the network storage devices; calculating an absolute path of all the storage devices through a mounted point and a system volume; collecting the above information to update the path information of the file system; and then calling a corresponding test algorithm and stressing strategy according to different types of storage devices, so as to perform the stress test. The stress testing method can make the file system display storage devices without a drive letter, and call appropriate testing methods and stressing strategies for different types of storage devices, so the depth and scope of the stress testing for file system are expanded, the accuracy of the test is enhanced, and the problem of occupying too many system resources is avoided.