The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 09, 2010
Filed:
Oct. 30, 2007
Lei He, Tianjin, CN;
Quan-jie Zheng, Tianjin, CN;
Jhih-ren Jin, Tianjin, CN;
Jeff Song, Taipei, TW;
Tom Chen, Taipei, TW;
Win-harn Liu, Taipei, TW;
Lei He, Tianjin, CN;
Quan-Jie Zheng, Tianjin, CN;
Jhih-Ren Jin, Tianjin, CN;
Jeff Song, Taipei, TW;
Tom Chen, Taipei, TW;
Win-Harn Liu, Taipei, TW;
Inventec Corporation, Taipei, TW;
Abstract
A device and a method for testing SAS channels which are applied to a plurality of pairs of SAS interfaces. The testing device includes a control terminal, a PCI-E microprocessor, a PCI-E-to-SAS adaptor, and a signal feedback module. The control terminal is used for selecting SAS channels and sending a control command; the PCI-E microprocessor is used for receiving the control command and sending a test signal to a PCI-E channel according to the control command; the PCI-E-to-SAS adaptor is used for converting a transmission signal between the PCI-E channel and the SAS channels; and the signal feedback module is used for connecting a first SAS interface to a second SAS interface in the SAS back plate. The PCI-E microprocessor compares whether the test signal sent to the first SAS channel is consistent with the test signal received from the second SAS interface.