Lei He

Title: Lei He - Innovator in Data Management and Testing Technologies

Introduction

Lei He is a prominent inventor based in Tianjin, China. He has made significant contributions to the fields of data management and testing technologies. With a total of 2 patents, Lei has developed innovative solutions that enhance system efficiency and reliability.

Latest Patents

One of Lei He's latest patents is titled "System and method for updating dirty data of designated raw device." This invention is applied in Linux systems and focuses on updating dirty data without interrupting normal system operations. The method involves determining a command parameter format, seeking a data structure based on this parameter, and utilizing a fast search tree to locate and update dirty data pages efficiently.

Another notable patent is "Device and method for testing SAS channels." This invention is designed for testing multiple pairs of SAS interfaces. The testing device includes a control terminal, a PCI-E microprocessor, a PCI-E-to-SAS adaptor, and a signal feedback module. The system allows for the selection of SAS channels and the comparison of test signals to ensure consistency between interfaces.

Career Highlights

Lei He is currently employed at Inventec Corporation, where he continues to innovate and develop cutting-edge technologies. His work has significantly impacted the efficiency of data management systems and testing methodologies.

Collaborations

Lei has collaborated with several talented individuals, including Tom Chen and Win-Harn Liu, who contribute to the innovative environment at Inventec Corporation.

Conclusion

In summary, Lei He is a distinguished inventor whose work in data management and testing technologies has led to significant advancements in the field. His patents reflect a commitment to enhancing system performance and reliability.