Company Filing History:
Years Active: 1982-2005
Title: Innovations of William S. Gornall
Introduction
William S. Gornall is a notable inventor based in Fairport, NY (US), recognized for his contributions to optical measurement technology. He holds two patents that showcase his innovative approach to laser wavelength measurement.
Latest Patents
Gornall's latest patents include a laser wavelength meter and an interferometer apparatus for direct measurement of wavelength. The laser wavelength meter utilizes a Michelson interferometer with a flexure scanner, designed to achieve long life through a unique oscillation mechanism. This design allows for significant optical path length changes while maintaining accuracy in wavelength measurements. The second patent, a dual beam interferometer, enables high-accuracy measurements of wavelength and frequency without the need for corrections related to the index of refraction.
Career Highlights
Throughout his career, Gornall has worked with reputable companies such as Burleigh Instruments, Inc. and Burleigh Products Group, Inc. His work has significantly advanced the field of optical measurement, particularly in laser technology.
Collaborations
Gornall has collaborated with Michael T. Houk, contributing to the development of innovative optical measurement solutions.
Conclusion
William S. Gornall's inventions have made a lasting impact on the field of optical measurement, demonstrating his expertise and innovative spirit. His work continues to influence advancements in laser technology and measurement accuracy.
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