The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 1982
Filed:
Feb. 25, 1980
Applicant:
Inventor:
William S Gornall, Fairport, NY (US);
Assignee:
Burleigh Instruments, Inc., Fishers, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356346 ; 356349 ; 356363 ;
Abstract
A dual beam interferometer in which the motion of a mirror produces optical path variation resulting in fringes at photodetectors provides direct, selectable measurement of wavelength and frequency of an input laser beam with high accuracy and over a large frequency and wavelength range without the need for correction due to differences in the index of refraction over the range.
Gornall, William. (1982). Interferometer apparatus for the direct measurement of wavelength and (U.S. Patent No. 4319843). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4319843
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile