The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 2005
Filed:
Nov. 15, 2000
William S. Gornall, Fairport, NY (US);
Michael T. Houk, Fairport, NY (US);
William S. Gornall, Fairport, NY (US);
Michael T. Houk, Fairport, NY (US);
Burleigh Products Group, Inc., Victor, NY (US);
Abstract
A long life laser wavelength meter is based on a Michelson interferometer with a flexure scanner. The scanner has a bar, preferably balanced about a pivot axis defined by a flexural pivot which supports the bar. Retroreflectors are mounted on the bar, equally spaced from the pivot axis. Long life is obtained by cycling or oscillating the bar over a limited range of angular movement within the bending limits of the flexure, which obtains a predicted, essentially infinite cycle life of the flexure. A large optical path length change for each scan of the oscillating bar is obtained through the use of the retroreflectors which fold the optical paths of each arm of the interferometer before reaching a fixed end mirror. The end mirror directs each optical path back through the same set of optical components, including the retroreflectors, to a beamsplitter which combines the light beams from both paths creating an optical interference beam output to a detector. Wavelength measurements are based upon the use of a reference light beam of accurately known wavelength and an input light beam of unknown wavelength that is to be measured. The reference beam and input beam transverse identical optical paths in the interferometer, to a measurement system which separately detects intensity fringes created by interference of the reference and input beams. By providing input and reference beams which are coincident and which traverse identical paths systemic errors during scanning are substantially eliminated. Changes in optical path length greater than 100 mm are obtainable in a compact interferometer.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile