Michael T Houk

Title: Michael T. Houk: Innovator in Laser Wavelength Measurement

Introduction

Michael T. Houk is a notable inventor based in Fairport, NY (US). He has made significant contributions to the field of optical measurement, particularly with his innovative designs in laser technology. His work has led to the development of a unique laser wavelength meter that enhances measurement accuracy and reliability.

Latest Patents

Houk holds a patent for a long-life laser wavelength meter. This device is based on a Michelson interferometer equipped with a flexure scanner. The scanner features a balanced bar pivoted on a flexural pivot, which supports the bar. Retroreflectors are strategically mounted on the bar, ensuring they are equally spaced from the pivot axis. The design allows for cycling or oscillating the bar within the bending limits of the flexure, achieving a predicted, essentially infinite cycle life. The optical path length change is maximized through the use of retroreflectors, which fold the optical paths before reaching a fixed end mirror. This innovative approach enables precise wavelength measurements by comparing a reference light beam of known wavelength with an input light beam of unknown wavelength.

Career Highlights

Michael T. Houk is associated with Burleigh Products Group, Inc., where he has applied his expertise in optical measurement technologies. His work has been instrumental in advancing the capabilities of laser wavelength measurement systems.

Collaborations

Houk has collaborated with William S. Gornall, contributing to the development and refinement of optical measurement technologies.

Conclusion

Michael T. Houk's contributions to the field of laser wavelength measurement exemplify innovation and dedication to advancing optical technologies. His patented designs continue to influence the industry and enhance measurement accuracy.