William R Corbin

Title: **Innovator William R. Corbin: A Pioneer in DRAM Testing Technologies**

Introduction

William R. Corbin, a distinguished inventor based in Underhill, Vermont, has made significant contributions to the field of memory testing technologies. With a total of four patents to his name, Corbin's work primarily focuses on enhancing the reliability and efficiency of dynamic random-access memory (DRAM) systems. His innovative approaches have been influential in the computing sector, particularly at one of the leading technology companies, International Business Machines Corporation (IBM).

Latest Patents

Corbin's most recent patents demonstrate his expertise in developing methods for testing embedded DRAM arrays. One notable patent describes a "Method for Testing Embedded DRAM Arrays," which outlines a system for assessing DRAM functionality through a built-in self-test (BIST) process. This system utilizes a processor-based mechanism to generate test data patterns, allowing for thorough writes, a specific pause period, and subsequent reads from the DRAM blocks. A significant aspect of this innovation is the overlapping pause periods across multiple DRAM blocks, which optimizes testing time and efficiency.

Another key patent is titled "Testing Logic and Embedded Memory in Parallel." This innovative technique integrates logic scan chain testing procedures with memory BIST, facilitating simultaneous evaluations of both logic and memory components. By employing voltage isolation techniques and synchronized test clocks, this method enhances the testing capabilities of embedded systems. Corbin's test algorithm further refines the process, enabling seamless transitions between scan chain operations during BIST.

Career Highlights

Throughout his career at IBM, William R. Corbin has established himself as a pivotal figure in the advancement of memory technology. His patents not only reflect his ingenuity but also signify his commitment to improving the quality and performance of computational hardware. Corbin's focus on practical applications ensures that his innovations address real-world challenges faced by the tech industry.

Collaborations

Collaboration has played a vital role in Corbin's success. He has worked closely with esteemed colleagues such as Erik A. Nelson and Thomas E. Obremski. Their joint efforts have contributed to the development of groundbreaking testing methodologies, highlighting the importance of teamwork in the field of technological innovation.

Conclusion

William R. Corbin's contributions to the realm of DRAM testing and embedded memory technologies are commendable. His inventive spirit and collaborative approach have led to significant advancements that continue to shape the landscape of computer memory systems. As technology evolves, Corbin's patents will undoubtedly play a crucial role in ensuring the reliability and efficiency of future innovations.