William J Lewis

Title: William J. Lewis - Innovator in Device Testing and Evaluation

Introduction

William J. Lewis is a distinguished inventor based in Poughkeepsie, NY, who has made significant contributions in the field of device testing and evaluation. With a remarkable portfolio of 21 patents, his innovative work primarily focuses on the pre-silicon fairness evaluation of devices under test, showcasing his expertise in ensuring fairness and reliability in technology.

Latest Patents

Among his latest innovations, Lewis has developed a patent titled "Evaluating fairness in devices under test - Pre-silicon fairness evaluation to detect fairness issues pre-silicon." This invention involves the driving of multiple commands on various interfaces of a device under test. The state associated with the device is continually monitored to determine if the drivers should continue executing commands. Furthermore, a crucial aspect of the invention is assessing whether a predefined limit of testing has been reached, allowing for a judicious conclusion on the test's success or failure.

Career Highlights

William J. Lewis works at International Business Machines Corporation (IBM), a global leader in technology and consulting services. His career at IBM has been marked by consistent innovation and dedication to advancing technology in device testing.

Collaborations

Throughout his career, Lewis has collaborated with esteemed colleagues, including Dean G. Bair and Rebecca Marie Gott. These partnerships have fostered an environment of creativity and shared knowledge, leading to advanced solutions in the field of technology.

Conclusion

William J. Lewis exemplifies the spirit of innovation and dedication to advancing technology through his extensive patent portfolio and collaborative efforts. His work in evaluating fairness in devices ensures that the technology we rely on is both fair and effective, contributing significantly to the field of device testing.