The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2016

Filed:

Mar. 17, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Dean G. Bair, Bloomington, NY (US);

Rebecca M. Gott, Poughkeepsie, NY (US);

Edward J. Kaminski, Jr., Wynnewood, PA (US);

William J. Lewis, Poughkeepsie, NY (US);

Chakrapani Rayadurgam, Bangalore, IN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G11C 29/38 (2006.01); G11C 29/44 (2006.01);
U.S. Cl.
CPC ...
G11C 29/38 (2013.01); G11C 29/44 (2013.01);
Abstract

Embodiments relate to pre-silicon device testing using a persistent command table. An aspect includes receiving a value for a persistent command parameter from a user. Another aspect includes determining whether the value of the persistent command parameter is greater than zero. Another aspect includes based on determining whether the value of the persistent command parameter is greater than zero, selecting a number of commands equal to the value of the persistent command parameter from a regular command table of a driver of a device under test. Another aspect includes adding the selected commands to the persistent command table of the driver. Another aspect includes performing testing of the device under test via the driver using only commands that are in the persistent command table of the driver.


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