The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2020

Filed:

Jul. 26, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Dean G. Bair, Bloomington, NY (US);

Rebecca M. Gott, Poughkeepsie, NY (US);

Edward J. Kaminski, Jr., Wynnewood, PA (US);

William J. Lewis, Poughkeepsie, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/34 (2006.01); G06F 30/00 (2020.01); G06F 30/33 (2020.01); G01R 31/26 (2020.01); G06F 13/00 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3409 (2013.01); G01R 31/26 (2013.01); G06F 13/00 (2013.01); G06F 30/00 (2020.01); G06F 30/33 (2020.01);
Abstract

Pre-silicon fairness evaluation to detect fairness issues pre-silicon. Drivers drive a plurality of commands on one or more interfaces of a device under test to test the device under test. State associated with the device under test is checked. Based on the state, a determination is made as to whether the drivers are to continue driving commands against the device under test. Based on determining that the drivers are to continue driving the commands, a further determination is made as to whether a predefined limit has been reached. Based on determining the predefined limit has been reached, ending the test of the device under test in which the test fails.


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