William Daune Atwell

Title: The Innovations of William Daune Atwell

Introduction

William Daune Atwell is a notable inventor based in Spicewood, Texas. He has made significant contributions to the field of error detection and correction technology. With a total of 12 patents to his name, Atwell's work has advanced the reliability and efficiency of memory systems.

Latest Patents

One of Atwell's latest patents is a method and apparatus for error detection and correction, specifically a Random Access Error Detection and Correction unit (RAEDAC). This innovative unit incorporates a bit-wise error detection and correction unit (BEDAC) within a memory system. In one embodiment, a word-wise error detection and correction unit (WEDAC) operates in coordination with a BEDAC that performs a bit-wise parity calculation. In another embodiment, a WEDAC works alongside a full bit-wise BEDAC that calculates bit-wise check bits. The RAEDAC can also be applied to create a multi-dimensional EDAC, where the memory is partitioned into a stack of planes, and a stack-wise error detection and correction unit (SEDAC) is implemented.

Career Highlights

Throughout his career, Atwell has worked with various companies, including Madrone Solutions, Inc. His expertise in error detection and correction has positioned him as a key figure in the development of advanced memory systems.

Collaborations

Atwell has collaborated with notable individuals in his field, including Michael L Longwell and Jeffrey Van Myers. These partnerships have contributed to the success of his innovative projects.

Conclusion

William Daune Atwell's contributions to error detection and correction technology have made a lasting impact on the industry. His innovative patents and collaborations highlight his dedication to advancing memory system reliability.