The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2003

Filed:

Jun. 18, 1999
Applicant:
Inventors:

Michael L. Longwell, Austin, TX (US);

William Daune Atwell, Spicewood, TX (US);

Jeffrey Van Myers, Driftwood, TX (US);

Assignee:

Madrone Solutions, Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/100 ;
U.S. Cl.
CPC ...
G06F 1/100 ;
Abstract

A method for tracking errors in a memory system by detecting an error in a bit of a word accessed in the memory and maintaining an error history comprising a record of each of the detected errors. The error history information may be used to configure the memory, such as to add redundancy; or may be used to adjust operating parameters of the memory, such as the periodicity of refresh and/or scrub operations; or may be used to trigger a sensing operation of other parameters in an application system. In one embodiment, a counter increments each time an error is detected and decrements when no error is detected, thereby tracking error patterns.


Find Patent Forward Citations

Longwell, Michael. (2003). Method for apparatus for tracking errors in a memory system (U.S. Patent No. 6560725). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6560725

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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