This inventor holds 1 USPTO granted patent. Top assignee: Asml Netherlands B.v.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Willem Petrus Van Aaken: Inventor in Charged-Particle Inspection
Introduction
Willem Petrus Van Aaken is an inventor based in Mierlo, the Netherlands. His patent work addresses beam-position correction in charged-particle inspection, a technology relevant to producing accurate inspection images.
Latest Patents
The provided information lists one patent associated with Van Aaken: “Beam Position Displacement Correction in Charged Particle Inspection.” The patent describes a method and system for correcting errors in inspection images. It acquires beam-position measurements at two wafer-stage velocities, calculates the beam’s displacement at an intermediate velocity, and adjusts the beam position based on that calculation. Van Aaken is credited with 1 patent.
Career Highlights
Van Aaken is associated with ASML Netherlands B.V. His listed patent focuses on compensating for beam displacement as a wafer stage moves, helping address image errors during charged-particle inspection.
Collaborations
The provided information names Te-Yu Chen and Funda Sahin as Van Aaken’s coworkers. Their specific contributions to the patent are not stated.
Conclusion
Willem Petrus Van Aaken’s listed invention concerns correcting beam-position displacement to improve charged-particle inspection images, reflecting his work in a field connected to semiconductor inspection technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile