Veldhoven, Netherlands

Willem Jan Grootjans


Average Co-Inventor Count = 4.3

ph-index = 2

Forward Citations = 30(Granted Patents)


Location History:

  • Eindhoven, NL (2014)
  • Veldhoven, NL (2016 - 2017)

Company Filing History:


Years Active: 2014-2017

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3 patents (USPTO):Explore Patents

Title: Innovator Spotlight: Willem Jan Grootjans

Introduction:

Willem Jan Grootjans, a talented inventor based in Veldhoven, Netherlands, has made significant contributions to the field of metrology of microscopic structures. With a total of 3 patents to his name, Grootjans has been at the forefront of developing methods and inspection apparatus for assessing the quality of reconstructions of parameters of interest in structures.

Latest Patents:

Grootjans' recent patents include a method and inspection apparatus for evaluating the quality of reconstruction of a parameter of interest in a structure, crucial for monitoring and controlling lithographic processes. This innovation enables accurate assessment without the need for a scanning electron microscope, utilizing predictive values of parameters to compare and validate reconstructions. Additionally, his invention of a method and apparatus for determining lithographic quality showcases his expertise in optimizing process conditions using periodic patterns and angularly resolved spectra.

Career Highlights:

Currently affiliated with ASML Netherlands B.V., a leading company in the semiconductor industry, Grootjans continues to drive innovation in lithographic processes. His expertise in metrology and quality assessment plays a vital role in enhancing the precision and efficiency of lithographic technologies.

Collaborations:

Collaborating with talented individuals such as Hugo Augustinus Joseph Cramer and Jouke Krist, Grootjans benefits from a dynamic team environment where innovative ideas are shared and developed. Together, they work towards advancing metrology solutions that push the boundaries of technological progress.

Conclusion:

In conclusion, Willem Jan Grootjans stands out as a pioneering inventor in the realm of metrology and lithographic quality assessment. His dedication to developing cutting-edge solutions exemplifies his commitment to driving technological advancements in the semiconductor industry. With a promising future ahead, Grootjans continues to inspire with his innovative spirit and contributions to the field.

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