Wen-Shiou Luo

Title: Innovations of Wen-Shiou Luo

Introduction

Wen-Shiou Luo is a prominent inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of technology, particularly in methods and systems for scene scanning and depth image acquisition. With a total of 6 patents to his name, his work continues to influence advancements in 3D modeling and imaging technologies.

Latest Patents

One of his latest patents is titled "Method and system for scene scanning." This innovation provides a method and system designed to obtain information for reconstructing a 3D model. The method involves projecting a characteristic pattern using an invisible light in a scene, capturing data of the scene and the pattern, and processing this data to reconstruct the model. Another notable patent is "Device for acquiring depth image, calibrating method and measuring method therefore." This device includes a projecting device, an image sensing device, and a processing unit that calibrates the sensing device to generate a 3D measuring parameter set, ultimately estimating depth information of the measured object.

Career Highlights

Wen-Shiou Luo is affiliated with the Industrial Technology Research Institute, where he continues to innovate and develop new technologies. His work has been instrumental in enhancing the capabilities of imaging systems and 3D modeling techniques.

Collaborations

Wen-Shiou collaborates with talented individuals such as Chia-Chen Chen and Tung-Fa Liou. Their combined expertise contributes to the success of their projects and advancements in their respective fields.

Conclusion

Wen-Shiou Luo's contributions to technology through his patents and collaborations highlight his role as a leading inventor in the field. His innovations in scene scanning and depth imaging are paving the way for future advancements in 3D modeling technologies.