The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2016

Filed:

Apr. 26, 2013
Applicant:

Industrial Technology Research Institute, Hsinchu, TW;

Inventors:

Tung-Fa Liou, Hsinchu, TW;

Wen-Shiou Luo, Hsinchu, TW;

Chia-Chen Chen, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/00 (2006.01); H04N 15/00 (2006.01); H04N 13/02 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
H04N 13/0239 (2013.01); G06T 7/0069 (2013.01); H04N 13/0246 (2013.01); H04N 13/0253 (2013.01); G06T 2207/10012 (2013.01); G06T 2207/10028 (2013.01); H04N 13/0296 (2013.01); H04N 2213/001 (2013.01);
Abstract

A device for acquiring depth image, a calibrating method and a measuring method therefore are provided. The device includes at least one projecting device, at least one image sensing device, a mechanism device and a processing unit. The projecting device projects a projection pattern to a measured object. The image sensing device is controlled to adjust a focal length and focus position, and therefore sense real images. The mechanism device adjusts a location and/or a convergence angle of the image sensing device. The processing unit calibrates the at least one image sensing device and generates a three dimension (3D) measuring parameter set at a model focal length according to a plurality of image setting parameter reference sets corresponding to a model focal length and a plurality of default node distances, respectively, and then estimates a depth map or depth information of the measured object.


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