The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 2016

Filed:

Apr. 12, 2013
Applicant:

Industrial Technology Research Institute, Hsinchu, TW;

Inventors:

Wen-Shiou Luo, Hsinchu, TW;

Chia-Chen Chen, Hsinchu, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2006.01); G06T 3/40 (2006.01); H04N 13/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0081 (2013.01); G06T 3/40 (2013.01); G06T 7/0075 (2013.01); G06T 2207/10012 (2013.01); G06T 2207/10021 (2013.01); G06T 2207/20132 (2013.01); H04N 2013/0081 (2013.01);
Abstract

A three dimensional (3D) sensing method and an apparatus thereof are provided. The 3D sensing method includes the following steps. A resolution scaling process is performed on a first pending image and a second pending image so as to produce a first scaled image and a second scaled image. A full-scene 3D measurement is performed on the first and second scaled images so as to obtain a full-scene depth image. The full-scene depth image is analyzed to set a first region of interest (ROI) and a second ROI. A first ROI image and a second ROI image is obtained according to the first and second ROI. Then, a partial-scene 3D measurement is performed on the first and second ROI images accordingly, such that a partial-scene depth image is produced.


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