Location History:
- San-Chong, TW (1999)
- Hsinchu, TW (2005)
Company Filing History:
Years Active: 1999-2005
Title: Innovator Wen-Chung Lee: Advancements in Measurement and Testing Technologies
Introduction
Wen-Chung Lee, an inventor based in Hsinchu, Taiwan, has made significant contributions to the field of microelectronics through his innovative approaches to measurement and testing technologies. With a total of two patents to his name, Lee has been pivotal in enhancing the accuracy and efficiency of measurement tools used in the semiconductor industry.
Latest Patents
Wen-Chung Lee's latest patents reflect his expertise and commitment to improving technological processes. The first patent is titled "Linewidth Measurement Tool Calibration Method Employing Linewidth Standard." This invention introduces a calibration method that employs a correction mechanism based on actual measurements and mathematical regression data. By utilizing an exponentially weighted moving average of deviations from these measurements, the method offers a more precise calibration for linewidth measurement tools, ultimately leading to improved accuracy in measuring linewidths of microelectronic products.
The second patent, "Method of Fast Testing of Hot Carrier Effects," addresses the testing time associated with hot carrier injection effects in CMOS transistors. This innovative approach involves applying a substrate back bias that extends the drain-to-source punch-through voltage. This enhancement allows for a higher stress voltage, significantly reducing the time needed to assess parameter degradation caused by hot carrier injection.
Career Highlights
Currently, Wen-Chung Lee works at Taiwan Semiconductor Manufacturing Company Limited (TSMC), a world-renowned leader in semiconductor manufacturing. Within this cutting-edge environment, Lee has been able to apply his innovative methodologies, pushing the boundaries of what is possible in microelectronics.
Collaborations
Throughout his career, Wen-Chung Lee has collaborated with talented individuals such as Li-Huan Chu and Pey-Yuan Lee. Their teamwork not only enhances the innovative process but also fosters a research environment where groundbreaking ideas flourish.
Conclusion
Wen-Chung Lee's contributions to measurement and testing technologies in the semiconductor industry exemplify the impact of innovation in engineering. His patents signify advancements that enhance the precision of measurement tools and improve testing efficiency, solidifying his status as a noteworthy inventor within the field. As technology continues to evolve, Lee’s work will undoubtedly play a crucial role in shaping the future of microelectronics.