Suzhou, China

Weiwei Sang


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2017-2023

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2 patents (USPTO):Explore Patents

Title: Weiwei Sang: Innovator in Integrated Circuit Technology

Introduction

Weiwei Sang is a prominent inventor based in Suzhou, China. He has made significant contributions to the field of integrated circuits, holding a total of 2 patents. His work focuses on enhancing the stability and testing capabilities of integrated circuits, particularly those with embedded memory modules.

Latest Patents

Weiwei Sang's latest patents include an integrated circuit with embedded memory modules. This invention relates to a system and method for maintaining stability during a scan shift operation on multiple embedded memories in an integrated circuit. The integrated circuit comprises a plurality of memory modules and a built-in self-test controller, which are arranged to reduce toggling of cells in the memory modules during a scan shift operation. Another notable patent is a method and apparatus for testing integrated circuits. This invention features an integrated circuit that includes a memory for storing data and a memory built-in self-test (MBIST) unit. The MBIST unit is coupled to the memory for testing its operation, allowing both memory and logic circuitry to be tested in parallel.

Career Highlights

Weiwei Sang is currently employed at NXP USA, Inc., where he continues to innovate in the field of integrated circuits. His expertise in memory modules and testing methodologies has positioned him as a valuable asset in the technology sector.

Collaborations

Weiwei has collaborated with notable colleagues such as Wanggen Zhang and Wenbin Yang. Their combined efforts contribute to advancements in integrated circuit technology.

Conclusion

Weiwei Sang's contributions to integrated circuit technology through his patents and collaborations highlight his role as an influential inventor in the field. His work continues to pave the way for innovations in memory and testing methodologies.

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