Wei-Hsun Lin

Title: Wei-Hsun Lin: Innovator in Semiconductor Testing

Introduction

Wei-Hsun Lin is a prominent inventor based in Zhubei, Taiwan. He has made significant contributions to the field of semiconductor testing, holding a total of 9 patents. His work focuses on developing methods and systems that enhance the efficiency and reliability of testing semiconductor devices.

Latest Patents

Wei-Hsun Lin's latest patents include innovative methods for wafer-level testing of semiconductor devices. One of his notable inventions provides a comprehensive method for testing a device under test (DUT). This method involves applying a voltage to the DUT's input terminal during a specified period, followed by a stress signal application. The stress signal consists of multiple sequences, each featuring ramp-up and ramp-down stages. The output signal from the DUT is then compared with the stress signal to assess performance. Another patent outlines a similar approach, where an integrated circuit (IC) on a wafer is energized and subjected to a stress signal to determine compliance with test criteria.

Career Highlights

Wei-Hsun Lin is currently employed at Taiwan Semiconductor Manufacturing Company Limited, a leading firm in the semiconductor industry. His expertise in testing methodologies has positioned him as a valuable asset to the company. His contributions have played a crucial role in advancing semiconductor technology and ensuring product reliability.

Collaborations

Wei-Hsun Lin has collaborated with notable colleagues, including Mill-Jer Wang and Ching-Nen Peng. These partnerships have fostered innovation and have been instrumental in the development of cutting-edge testing solutions.

Conclusion

Wei-Hsun Lin's work in semiconductor testing exemplifies the importance of innovation in technology. His patents and contributions continue to influence the industry, ensuring that semiconductor devices meet rigorous testing standards.