Carrollton, TX, United States of America

Weerakiat Wahawisan


Average Co-Inventor Count = 3.9

ph-index = 4

Forward Citations = 74(Granted Patents)


Company Filing History:


Years Active: 1998-2004

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5 patents (USPTO):Explore Patents

Title: Weerakiat Wahawisan: Innovator in Semiconductor Inspection Technologies

Introduction

Weerakiat Wahawisan is a notable inventor based in Carrollton, TX (US), recognized for his contributions to semiconductor inspection technologies. With a total of five patents to his name, he has made significant advancements in the field, particularly in the inspection of semiconductor devices.

Latest Patents

One of his latest patents is titled "System and method for inspecting bumped wafers." This innovative system is designed to inspect components, such as dies formed on silicon wafers. It includes a two-dimensional inspection system that locates features like bump contacts on the die and generates feature coordinate data. Additionally, it incorporates a three-dimensional inspection system that receives this data to produce inspection control data.

Another significant patent is "Method and apparatus for inspecting a workpiece." This invention utilizes a computer vision apparatus and methods for automatically inspecting both two-dimensional (2D) and three-dimensional (3D) criteria of objects using a single camera and laser sources. The system illuminates the object under inspection, allowing for detailed image data collection for both 2D and 3D analysis. Specific implementations of this technology are aimed at inspecting packaged semiconductor devices, including Ball-Grid Arrays (BGAs) and Quad Flat Packages (QFPs).

Career Highlights

Weerakiat Wahawisan is currently employed at Semiconductor Technologies & Instruments Pte. Ltd., where he continues to develop innovative solutions for the semiconductor industry. His work focuses on enhancing the quality and efficiency of semiconductor inspections, which are critical for the manufacturing process.

Collaborations

Throughout his career, Weerakiat has collaborated with notable professionals in the field, including Rajiv Roy and Michael C Zemek. These collaborations have contributed to the advancement of inspection technologies and have fostered innovation within the industry.

Conclusion

Weerakiat Wahawisan's contributions to semiconductor inspection technologies have made a significant impact on the industry. His innovative patents and ongoing work at Semiconductor Technologies & Instruments Pte. Ltd. highlight his dedication to improving inspection processes and ensuring the quality of semiconductor devices.

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