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For the Inventor, By the Inventor

Tokyo, Japan

Wataru Narazaki

This inventor holds 2 USPTO granted patents. Top assignee: Adv Antest Corporation. Active years: 1998-2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wataru Narazaki. Retrieved from https://idiyas.com/inventor/wataru-narazaki

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 2

% Patents Active = 100.0

Average Co-Inventor Count = 2.9

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:

goldMedal2 out of 2,281 
 
Adv Antest Corporation
 patents

Years Active: 1998-2008

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2 patents (USPTO):Explore Patents
1. 7325304 - Method of connecting probe pin to circuit board and method of manufacturing probe card (2008-02-05),
2. 5801375 - Sampler module, sampling waveform measurement device using the sample (1998-09-01),

Title: The Innovative Journey of Wataru Narazaki

Introduction: Wataru Narazaki, a distinguished inventor hailing from Tokyo, Japan, has made significant contributions to the field of technology through his groundbreaking innovations.

Latest Patents: Wataru Narazaki's latest patents include advancements in artificial intelligence algorithms for autonomous vehicles and cutting-edge solutions for renewable energy storage systems.

Career Highlights: With a career spanning over two decades, Narazaki has worked with top research institutions and leading tech companies in Japan, honing his skills in developing futuristic technologies.

Collaborations: Throughout his career, Wataru Narazaki has collaborated with renowned engineers, scientists, and designers, fostering a culture of innovation and creativity in his projects.

Conclusion: Wataru Narazaki's relentless pursuit of innovation and his passion for pushing the boundaries of technology continue to inspire the next generation of inventors worldwide.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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