Adv Antest Corporation

Wataru Narazaki

Tadao Saito

Takeshi Konno

Takao Sakurai

Kouji Sasaki

Masaichi Hashimoto

There is provided a method of manufacturing a probe card that electrically connects a testing device and a device under test to transmit a signal between the testing device and the device under test. The method includes the steps of forming a probe pin on a probe pin substrate, joining the probe pin held on the probe pin substrate to a circuit board, and cutting the probe pin to separate the probe pin substrate from the probe pin.

Method of connecting probe pin to circuit board and method of manufacturing probe card

A sampler module is disclosed for use in a sampling waveform measurement device that samples subject signals and measures the waveform of the signals. The module is constructed by accommodating within a metal container: a laser diode driver circuit that receives laser drive sampling pulse signals from the outside and supplies pulse drive signals by a gain switching method, a laser diode that receives the drive signals from the LD driver circuit and generates optical probe pulse light, a sampling photoconductor that performs switching in accordance with irradiated light pulses and samples the subject signals, a condenser that focuses optical probe pulse light from the laser diode upon the photoconductor, and cooling temperature control means that maintains the temperature of the laser diode at a fixed temperature.

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Tokyo, Japan

Wataru Narazaki