WanGeng Li

Title: The Innovations of WanGeng Li

Introduction

WanGeng Li is a notable inventor based in Shanghai, China. He has made significant contributions to the field of semiconductor testing. His innovative approach has led to the development of a unique patent that enhances the efficiency of wafer acceptance testing.

Latest Patents

WanGeng Li holds a patent for a "Wafer acceptance test tool and test method using thereof." This method involves pressing probes against probe pads on a test line over a substrate to form first probe marks. The process includes capturing images of these marks, transmitting them to an image inspection machine, and determining their acceptability. If the marks are deemed acceptable, a first wafer acceptance test is performed on the substrate.

Career Highlights

Throughout his career, WanGeng Li has worked with prominent companies in the semiconductor industry. He has been associated with Taiwan Semiconductor Manufacturing Company Ltd. and TSMC China Company Limited. His experience in these organizations has contributed to his expertise in semiconductor testing technologies.

Collaborations

WanGeng Li has collaborated with talented individuals in his field, including Jin Yao and SenSen Zhang. These collaborations have fostered innovation and advancement in semiconductor testing methodologies.

Conclusion

WanGeng Li's contributions to the field of semiconductor testing through his patent and career experiences highlight his role as an influential inventor. His work continues to impact the industry positively.