Wai Loon Yip

Title: Wai Loon Yip: Innovator in Die Testing Technology

Introduction

Wai Loon Yip is a notable inventor based in Penang, Malaysia. He has made significant contributions to the field of integrated circuit (IC) technology. His innovative approach has led to the development of a unique patent that enhances die testing processes.

Latest Patents

Wai Loon Yip holds a patent titled "Die stack override for die testing." This patent discloses structures and techniques for exposing circuitry during die testing. In some embodiments, an IC die may include first conductive contacts at a first face of the die, second conductive contacts at a second face of the die, die stack emulation circuitry, and other circuitry. A switch is coupled to the second conductive contacts, the die stack emulation circuitry, and the other circuitry. The switch is designed to couple the second conductive contacts to the other circuitry when in a first state, and to couple the die stack emulation circuitry to the other circuitry when in a second state, which is different from the first state. Wai Loon Yip has 1 patent to his name.

Career Highlights

Wai Loon Yip is currently employed at Intel Corporation, a leading technology company known for its advancements in semiconductor manufacturing. His work at Intel has allowed him to explore and develop innovative solutions in the field of die testing.

Collaborations

Wai Loon Yip has collaborated with talented coworkers such as Terrence Huat Hin Tan and Rehan M Sheikh. Their combined expertise contributes to the innovative environment at Intel Corporation.

Conclusion

Wai Loon Yip is a prominent figure in the realm of die testing technology, with a patent that showcases his inventive capabilities. His contributions continue to influence the industry and pave the way for future advancements.