Migdal Haemek, Israel

Vladimir Kamenetsky

USPTO Granted Patents = 1 

 

Average Co-Inventor Count = 9.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: Vladimir Kamenetsky: Innovator in Process Control Technology

Introduction

Vladimir Kamenetsky is a notable inventor based in Migdal Haemek, Israel. He has made significant contributions to the field of process control technology, particularly through his innovative patent. His work has implications for improving the quality metrics in manufacturing processes.

Latest Patents

Kamenetsky holds a patent titled "Method and system for providing a quality metric for improved process control." This invention involves acquiring a plurality of overlay metrology measurement signals from various metrology targets across a wafer. It includes determining overlay estimates using multiple algorithms, generating overlay estimate distributions, and creating quality metrics based on these distributions. Each quality metric is a function of the width and asymmetry of the corresponding overlay estimate distribution.

Career Highlights

Throughout his career, Kamenetsky has worked with prominent companies in the technology sector. He has been associated with Kla Corporation and KLA-Tencor Corporation, where he has contributed to advancements in metrology and process control.

Collaborations

Kamenetsky has collaborated with notable professionals in his field, including Daniel Kandel and Guy Cohen. Their collective expertise has likely enhanced the development and implementation of innovative solutions in process control.

Conclusion

Vladimir Kamenetsky's contributions to process control technology through his patent and career achievements highlight his role as an influential inventor in the industry. His work continues to impact the field positively.

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