Pelham, NH, United States of America

Vincent J Messina


Average Co-Inventor Count = 2.0

ph-index = 2

Forward Citations = 14(Granted Patents)


Company Filing History:


Years Active: 1989-2008

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2 patents (USPTO):Explore Patents

Title: Vincent J Messina: Innovator in Image Processing Technologies

Introduction

Vincent J Messina is a notable inventor based in Pelham, NH (US), recognized for his contributions to image processing technologies. He holds 2 patents that showcase his innovative approaches to detecting fabrication defects and enhancing image quality.

Latest Patents

One of his latest patents is titled "System and method for detecting and reporting fabrication defects using a multi-variant image analysis." This invention outlines an inspection process and system that utilizes multiple residual defect signals to identify and report defects in a copy of a standard. The process involves performing a multi-variant defect extraction method, applying predetermined transforms to both a data file containing the standard and an image file of the copy. This results in a series of conditioned data and image files from which residual defect signals are extracted. The method further employs these signals to report defects found in the analyzed images.

Another significant patent by Messina is the "Adaptive threshold circuit for image processing." This invention describes an adaptive threshold circuit that measures reflectance values across various scan lines on a document. The digitized image signal created from this process is designed to accurately recreate documents without objectionable light and dark variations, regardless of the original document's background color or illumination conditions. The method calculates mean values for digitized reflectance and updates threshold values to ensure accurate binary assignments for image processing.

Career Highlights

Throughout his career, Vincent J Messina has worked with various companies, including Lamda-lite Enterprises Incorporated. His work has significantly impacted the field of image processing, particularly in defect detection and image quality enhancement.

Collaborations

Messina has collaborated with notable individuals such as Alan L Moyer and Donald Ronning, contributing to advancements in his field through shared expertise and innovative ideas.

Conclusion

Vincent J Messina's work in image processing technologies exemplifies his commitment to innovation and excellence. His patents reflect a deep understanding of complex systems and a drive to improve the accuracy and quality of image reproduction.

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