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Lamda-lite Enterprises Incorporated

Vincent J Messina

Alan L Moyer

Donald Ronning

An inspection process and an inspection system () that utilize a plurality of residual defect signals(),(), . . .() to identify and report defects of interest in a copy () of a standard (). The process includes performing a multi-variant defect extraction method () that includes applying a number n of pre-determined transforms to both a data file () containing the standard and an image file () containing the copy of the standard so as to create a plurality of conditioned data files ((),(), . . .()) and a plurality of conditioned image files ((),(), . . .()). The plurality of residual defect signals are extracted from these conditioned files. A defect analysis and reporting method () utilizes the residual defect signals to report defects contained in two or more of the residual defect signals.

System and method for detecting and reporting fabrication defects using a multi-variant image analysis

An adaptive threshold circuit is disclosed wherein reflectance values are measure D in each of a number of scan lines on a document on which an image is scanned, digitized at a multiplicity of points and processed to create a processed digitized image signal that is stored or transmitted and then used to recreate the document accurately without objectional light and dark variations over the recreated documents and without being affected by the background color of the original document, variations in illuminating and the black/white makeup of the image. The unprocessed digitized data is first used to calculate a mean value of the digitized reflectance values for each of a number of columns on the document. The same data is then used to calculate a mean-above-mean value for the same columns. Each digitized reflectance value is compared to the mean value and only when it exceeds the mean value is the mean-above-mean value updated. A threshold value is then calculated for each column using the updated mean above mean values for a particular column and for the two contiguous columns. At the same time the most recent threshold value for each column is compared to each unprocessed digitized reflectance value taken in the associated column and values above the threshold value are assigned a first binary value indicating the sample is white and values equal to or below are assigned the opposite binary value indicating the sample is black.

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Pelham, NH, United States of America

Vincent J Messina