Vincent E Lopopolo

Title: Vincent E Lopopolo: Innovator in Multi-Wafer Testing Technology

Introduction

Vincent E Lopopolo is a notable inventor based in San Jose, CA. He has made significant contributions to the field of semiconductor testing. His innovative approach has led to the development of a unique testing apparatus that enhances efficiency and cost-effectiveness.

Latest Patents

Vincent holds a patent for a "Method and apparatus for massively parallel multi-wafer test." This invention discloses a cost-effective and efficient massively parallel multi-wafer test cell. The test cell is designed for both single-touchdown and multiple-touchdown applications. It utilizes a novel 'split-cartridge' design, which, combined with a method for aligning wafers when separated from the probe card assembly, creates an effective multi-wafer test cell. Additionally, a 'probe-card stops' design may be incorporated within the cartridge to simplify the overall design and operation.

Career Highlights

Vincent is currently associated with Adv Antest Corporation, where he continues to innovate in the field of semiconductor testing. His work has been instrumental in advancing testing methodologies that benefit the industry.

Collaborations

Vincent has collaborated with notable professionals in his field, including John William Andberg and Ira Leventhal. Their combined expertise has contributed to the success of various projects and innovations.

Conclusion

Vincent E Lopopolo is a distinguished inventor whose work in multi-wafer testing technology has made a significant impact on the semiconductor industry. His innovative solutions continue to pave the way for advancements in testing methodologies.