Pune, India

Vijay Sharma

This inventor holds 3 USPTO granted patents and 3 published patent applications. Top assignees: Lsi Corporation, Avago Technologies General IP (Singapore) Pte. Ltd.. Active years: 2014-2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Vijay Sharma. Retrieved from https://idiyas.com/inventor/vijay-sharma-e6gtbi3s

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 3 

% Patents Active = 33.3

Average Co-Inventor Count = 2.3

ph-index = 1

Forward Citations = 2(Granted Patents)


Location History:

  • Pune, IN (2014)
  • Bengaluru, IN (2016)

Company Filing History:


Years Active: 2014-2016

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3 patents (USPTO):Explore Patents

Title: The Innovative Mind of Vijay Sharma

Introduction

Vijay Sharma is a notable inventor based in Pune, India. He has made significant contributions to the field of integrated circuit design and testing. With a total of 3 patents to his name, Sharma's work has had a considerable impact on improving the efficiency and effectiveness of electronic systems.

Latest Patents

One of his latest patents is titled "Integrated clock architecture for improved testing." This invention involves a computer system that includes a first on-chip controller and a second on-chip controller, both connected to a control element. In normal operation, these controllers function in different clock domains. However, during testing, the control element enables both controllers to generate substantially similar clock signals. This innovation reduces the overhead associated with testing by allowing for more efficient testing of similar circuitry connected to each controller. Additionally, a delay can be incorporated into the clock signal path of one controller to minimize instantaneous power draw during testing.

Another significant patent by Sharma is "Scan circuitry for testing input and output functional paths of an integrated circuit." This patent describes an integrated circuit that comprises scan test circuitry and additional circuitry subject to testing. The scan test circuitry includes a scan chain with multiple scan cells, and the associated control circuitry is linked to the primary input and output of the integrated circuit. This configuration allows for comprehensive testing of both input and output functional paths, enhancing the reliability of integrated circuits.

Career Highlights

Vijay Sharma has worked with prominent companies in the technology sector, including LSI Corporation and Avago Technologies General IP (Singapore) Pte. Ltd. His experience in these organizations has contributed to his expertise in integrated circuit design and testing methodologies.

Collaborations

Throughout his career, Sharma has collaborated with talented professionals such as Ramesh C Tekumalla and Prakash Krishnamoorthy. These collaborations have fostered innovation and have led to the development of advanced technologies in the field.

Conclusion

Vijay Sharma's contributions to the field of integrated circuits and testing are noteworthy. His innovative patents reflect his commitment to enhancing electronic systems and improving testing methodologies. His work continues to influence the industry and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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