Location History:
- Fremont, CA (US) (2006 - 2007)
- San Jose, CA (US) (2011)
Company Filing History:
Years Active: 2006-2011
Title: Varoujan Chakarian: Innovator in Defect Analysis Technologies
Introduction
Varoujan Chakarian is a notable inventor based in Fremont, CA, who has made significant contributions to the field of defect analysis technologies. With a total of 3 patents to his name, Chakarian's work focuses on systems and methods that enhance the understanding and analysis of defects in various specimens.
Latest Patents
Chakarian's latest patents include innovative systems and methods for acquiring information about defects on specimens. One of his notable inventions involves a system that integrates an optical subsystem to gather topography information and an electron beam subsystem to obtain additional data about the defect. This method allows for the acquisition of both optical and electron beam data while the specimen is maintained in a single vacuum chamber. Another significant patent relates to automated focusing of electron images, where adjustments are made to the focusing condition in response to changes in the EF cut-off voltage, thereby optimizing the imaging process.
Career Highlights
Chakarian is currently associated with KLA-Tencor Technologies Corporation, a leading company in the field of process control and yield management solutions. His work at KLA-Tencor has positioned him as a key player in advancing technologies that improve defect detection and analysis.
Collaborations
Throughout his career, Chakarian has collaborated with esteemed colleagues such as Gabor D. Toth and Douglas K. Masnaghetti, contributing to the development of cutting-edge technologies in his field.
Conclusion
Varoujan Chakarian's innovative contributions to defect analysis technologies have established him as a prominent figure in his industry. His patents reflect a commitment to enhancing the understanding of defects, which is crucial for various applications in technology and manufacturing.