Company Filing History:
Years Active: 2005-2010
Title: Valery Alexeyev: Innovator in Ion Source Technology
Introduction
Valery Alexeyev is a prominent inventor based in Moscow, Russia. He has made significant contributions to the field of ion source technology, holding a total of 4 patents. His work focuses on enhancing the efficiency and quality of ion sources used in various applications.
Latest Patents
Among his latest patents is the "Sputtered Contamination Shielding for an Ion Source." This innovation addresses the issue of sputtered contaminants that can affect the quality of target substrates. By implementing shielding associated with an ion source, such as an anode layer source, the amount of contaminants impinging on the substrate is significantly reduced. This results in a higher quality substrate with minimized contamination.
Another notable patent is the "Modular Ion Source." This design features a modular approach that allows for the coupling of short core components to create a longer ion source while maintaining an acceptable tolerance of the anode-cathode gap. The flexible anode adapts to inconsistencies in the ion source body, ensuring a uniform gap along the length of the source. Additionally, a clamp configuration secures the cooling tube to the ion source body, preventing warping during manufacturing.
Career Highlights
Valery Alexeyev is currently employed at Veeco Instruments Inc., where he continues to innovate in the field of ion sources. His expertise and inventions have contributed to advancements in technology that are crucial for various industrial applications.
Collaborations
Throughout his career, Valery has collaborated with notable colleagues, including Daniel E Siegfried and David Matthew Burtner. These collaborations have further enriched his work and expanded the impact of his inventions.
Conclusion
Valery Alexeyev's contributions to ion source technology exemplify the importance of innovation in enhancing industrial processes. His patents reflect a commitment to improving quality and efficiency in the field.