Kiriat Ekron, Israel

Vadim Kuchik

USPTO Granted Patents = 2 

Average Co-Inventor Count = 2.4

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2021-2025

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2 patents (USPTO):Explore Patents

Title: Vadim Kuchik: Innovator in Semiconductor Inspection Technologies

Introduction

Vadim Kuchik is a notable inventor based in Kiriat Ekron, Israel, recognized for his contributions to semiconductor inspection technologies. With a total of two patents to his name, Kuchik has developed innovative methods that enhance the detection and analysis of structural elements within semiconductor devices.

Latest Patents

Kuchik's latest patents include a method for determining the depth of a hidden structural element and a method for detecting voids in a metal line of a semiconductor device die. The first patent outlines a technique that involves obtaining contrast information between hidden structural element detection signals and surroundings detection signals. This method utilizes an illuminating electron beam to scan a region of the object, allowing for the determination of the depth of the hidden structural element based on the contrast information obtained. The second patent focuses on detecting voids in a metal line by scanning an electron beam over a selected location on the die. It involves analyzing gray levels in an image produced by backscattered electrons to identify voids based on differences in gray levels.

Career Highlights

Throughout his career, Vadim Kuchik has worked with prominent companies in the semiconductor industry, including Applied Materials Israel Limited and Applied Materials, Inc. His experience in these organizations has contributed significantly to his expertise in semiconductor technologies and inspection systems.

Collaborations

Kuchik has collaborated with various professionals in his field, including Dror Shemesh and Nicolas L. Breil. These collaborations have likely enriched his work and contributed to the development of his innovative patents.

Conclusion

Vadim Kuchik stands out as an inventor whose work in semiconductor inspection technologies has the potential to impact the industry significantly. His innovative methods for detecting hidden structural elements and voids in semiconductor devices demonstrate his commitment to advancing technology in this critical field.

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