This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Applied Materials Israel Limited. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Innovations by Tung-Yuan Hsieh in Semiconductor Manufacturing
Introduction
Tung-Yuan Hsieh is an inventor based in Tainan City, Taiwan. He is known for his contributions to the field of semiconductor manufacturing, particularly through his innovative approaches to overlay target determination using machine learning. His work aims to enhance the efficiency and accuracy of semiconductor production processes.
Latest Patent Applications
Tung-Yuan Hsieh has filed a patent application titled "OPTIMAL DETERMINATION OF AN OVERLAY TARGET USING MACHINE LEARNING." This application describes systems and methods that involve obtaining a design image of a given overlay target, which consists of multiple stacked semiconductor layers. The design image is fed into a trained machine learning model to simulate an image that would be captured by an electron beam examination system. The simulation helps in determining data informative of at least one simulated overlay in the image. This data is then used to select an optimal overlay target among various options, which can be manufactured on a semiconductor specimen.
Conclusion
Tung-Yuan Hsieh's innovative approach to semiconductor manufacturing through machine learning represents a significant advancement in the field. His patent application reflects a commitment to improving manufacturing processes and optimizing production outcomes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile