Hsinchu, Taiwan

Tsukada Kazunori

This inventor holds 1 USPTO granted patent. Top assignee: Taiwan Semiconductor Manufacturing Comp. Ltd.. Active years: 2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tsukada Kazunori. Retrieved from https://idiyas.com/inventor/tsukada-kazunori

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: Tsukada Kazunori: Innovator in Semiconductor Technology

Introduction

Tsukada Kazunori is a prominent inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of semiconductor technology, particularly in improving the uniformity of gate oxide layers.

Latest Patents

Kazunori holds a patent titled "Method and apparatus for improved gate oxide uniformity with reducing system contaminants." This invention focuses on enhancing the uniformity of a thermally grown silicon dioxide layer. The method involves thermally growing a layer over exposed silicon portions, exposing gas reactant feed lines to reactant gases during the thermal growth process, and purging gas flow pathways to remove residual reactant gas contaminants. This innovative approach aims to improve the quality of subsequently thermally grown silicon dioxide layers.

Career Highlights

Kazunori is associated with Taiwan Semiconductor Manufacturing Company Limited, a leading player in the semiconductor industry. His work has been instrumental in advancing manufacturing processes that are critical for the production of high-performance semiconductor devices.

Collaborations

He has collaborated with notable colleagues, including Chin-Tsai Chen and Chao-Po Lu, contributing to various projects that enhance semiconductor technology.

Conclusion

Tsukada Kazunori's innovative work in semiconductor technology, particularly his patent on gate oxide uniformity, showcases his commitment to advancing the field. His contributions continue to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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