Tsafrir Israeli

Title: Tsafrir Israeli: Patents in Memory Testing and Circuit Characterization.

Introduction

Tsafrir Israeli is an inventor associated with Haifa, Israel. His patent work includes methods and apparatus for testing embedded memory and characterizing self-timed circuits. The supplied information lists 2 patents and identifies Intel Corporation as his company.

Latest Patents

“Method and Apparatus for Direct Access Test of Embedded Memory” describes an apparatus with embedded memory, external input and output connectors, and reconfigurable signal paths. In a first operating mode, these paths provide direct access to the memory, allowing input signals to reach it and output signals to return to the external source.

“Characterization of Self Time Circuit” presents a method for characterizing a self-timed circuit in an integrated circuit, such as a memory sense amplifier. A software-controlled test feature enables the sense amplifier earlier after word-line activation. A replacement timing circuit, activated by a falling clock edge, makes the enable signal sensitive to clock frequency. Software controls the clock frequency, while parity checking helps detect failures across tested integrated circuits.

Career Highlights

The listed patents reflect work on integrated-circuit testability, memory access, and circuit timing. The supplied information associates Israeli with Intel Corporation.

Collaborations

The supplied information names James M. Cleary and Douglas A. Guddat as Israeli’s coworkers.

Conclusion

Tsafrir Israeli’s listed inventions address practical approaches to embedded-memory testing and self-timed circuit characterization, with his patent record connected to his work at Intel Corporation.