The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 1999

Filed:

Oct. 18, 1996
Applicant:
Inventors:

Shekhar Patwardhan, Santa Clara, CA (US);

Tsafrir Israeli, Ein Arala, IL;

Eitan Rosen, Abirim, IL;

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C / ;
U.S. Cl.
CPC ...
365194 ; 365201 ; 36523008 ; 365233 ;
Abstract

Method and apparatus for characterization of a self timed circuit in an integrated circuit such as a sense amplifier in a memory. A software controlled testability feature is added to the integrated circuit permitting the sense amplifier to be enabled earlier in time following word line activation. In particular, a replacement timing circuit activated by a falling clock edge causes the sense amplifier enable signal to become clock frequency sensitive. The clock frequency is software controlled and parity checking provides a failure detection mechanism. A plurality of the integrated circuit are tested to provide the characterization.


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