Yokohama, Japan

Toshio Oshima

This inventor holds 6 USPTO granted patents. Top assignee: Sumitomo Electric Industries, Limited. Active years: 1987-2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Toshio Oshima. Retrieved from https://idiyas.com/inventor/toshio-oshima-0cc6r78u

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 83.3

Average Co-Inventor Count = 2.8

ph-index = 4

Forward Citations = 75(Granted Patents)


Company Filing History:


Years Active: 1987-2006

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6 patents (USPTO):Explore Patents

Title: Toshio Oshima: Optical Fiber Inspection and Selection

Introduction

Toshio Oshima is an inventor based in Yokohama, Japan, whose patent work includes methods and systems for inspecting optical fiber. He is associated with Sumitomo Electric Industries, Limited, and has 6 patents.

Latest Patents

Oshima’s latest listed patent, “Method for Selection of Optical Fiber and System for Inspection of Optical Fiber,” describes an approach to detecting anomalies in optical fiber using an optical time-domain reflectometer (OTDR) waveform.

The system measures the waveform and evaluates it at successive time points. It calculates the waveform’s gradient and changes in gradient, then checks whether those values fall within defined allowable ranges. This method is intended to support reliable anomaly detection and optical fiber selection.

Career Highlights

Oshima’s patent activity reflects work on optical fiber inspection technologies. His listed invention applies waveform analysis to assess fiber condition, connecting measurement and evaluation in a single inspection system.

Collaborations

Oshima is associated with Sumitomo Electric Industries, Limited. His listed coworkers include Yoshiaki Terasawa and Osamu Ichikawa.

Conclusion

Toshio Oshima’s patent work focuses on using OTDR waveform analysis to improve the inspection and selection of optical fiber.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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