The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2006
Filed:
Jul. 20, 2005
Shinji Endo, Yokohama, JP;
Yoshiaki Nagao, Yokohama, JP;
Toshiyuki Yamamoto, Yokohama, JP;
Toshio Oshima, Yokohama, JP;
Shinji Endo, Yokohama, JP;
Yoshiaki Nagao, Yokohama, JP;
Toshiyuki Yamamoto, Yokohama, JP;
Toshio Oshima, Yokohama, JP;
Sumitomo Electric Industries, Ltd., Osaka, JP;
Abstract
An optical fiber inspecting system comprises a waveform measuring unit for measuring an OTDR waveform for an optical fiber and a waveform evaluating unit for evaluating an anomaly within the optical fiber through a use of the measured waveform. The waveform evaluating unit comprises a calculating part and a detecting part. The calculating part calculates the gradient and the amount of change in gradient of the waveform at each time point by means of a gradient calculating section and a gradient change amount calculating section. The detecting part determines whether or not the gradient and the amount of change in gradient are within a defined allowable range of gradient and a defined allowable range of amount of change, respectively, by way of a gradient determining section and a gradient change amount determining section.