The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2005
Filed:
Mar. 25, 2003
Shinji Endo, Yokohama, JP;
Yoshiaki Nagao, Yokohama, JP;
Toshiyuki Yamamoto, Yokohama, JP;
Toshio Oshima, Yokohama, JP;
Shinji Endo, Yokohama, JP;
Yoshiaki Nagao, Yokohama, JP;
Toshiyuki Yamamoto, Yokohama, JP;
Toshio Oshima, Yokohama, JP;
Sumitomo Electric Industries, Ltd., Osaka, JP;
Abstract
An optical fiber inspecting systemA comprises a waveform measuring unitfor measuring an OTDR waveform for an optical fiber F to be inspected and a waveform evaluating unitfor evaluating an anomaly within the optical fiber. The waveform evaluating unitcomprises a calculating partand a detecting partThe calculating partcalculates the gradient and the amount of change in gradient of the waveform at each time point. The detecting partdetermines whether or not the gradient and the amount of change in gradient are within a defined allowable range of gradient and a defined allowable range of amount of change, respectively. This realizes an optical fiber inspecting system, an inspection method and a selecting method, all of which enable to detect reliably an anomaly within an optical fiber through an OTDR waveform.