Omiya, Japan

Toshiharu Hiji


Average Co-Inventor Count = 13.0

ph-index = 7

Forward Citations = 494(Granted Patents)


Company Filing History:


Years Active: 2004-2006

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7 patents (USPTO):

Title: The Innovations of Toshiharu Hiji

Introduction

Toshiharu Hiji is a notable inventor based in Omiya, Japan. He has made significant contributions to the field of technology, particularly in the development of advanced probe devices. With a total of 7 patents to his name, Hiji's work showcases his innovative spirit and technical expertise.

Latest Patents

One of Hiji's latest patents is a contact probe and probe device. This invention features a contact probe that includes a film and a plurality of wiring patterns formed on the film. Each wiring pattern has a front end portion that projects from the film, forming contact pins. Additionally, a metal layer is provided on the film. In one embodiment, the contact probe device consists of first and second contact probes connected to each other. The first contact probe includes a first film and a plurality of first wiring patterns, while the second contact probe includes a second film with a plurality of second wiring patterns. The second wiring patterns are connected to the first wiring patterns, and the second contact probe is formed separately from the first contact probe.

Career Highlights

Throughout his career, Hiji has worked with various companies, including Genesis Technology Inc. and Genesis Technology Incorporation. His experience in these organizations has allowed him to refine his skills and contribute to groundbreaking technological advancements.

Collaborations

Hiji has collaborated with several talented individuals in his field, including Hideaki Yoshida and Toshinori Ishii. These partnerships have fostered a creative environment that has led to innovative solutions and advancements in technology.

Conclusion

Toshiharu Hiji's contributions to the field of technology through his patents and collaborations highlight his role as a significant inventor. His work continues to influence the development of advanced probe devices, showcasing the importance of innovation in today's technological landscape.

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