Hamura, Japan

Tooru Fukui

This inventor holds 1 USPTO granted patent. Top assignees: Hitachi Tokyo Electronics Co., Ltd., Hitachi, Ltd.. Active years: 1992.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tooru Fukui. Retrieved from https://idiyas.com/inventor/tooru-fukui-50rpc6m1

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 33(Granted Patents)


Company Filing History:


Years Active: 1992

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1 patent (USPTO):Explore Patents

Introduction

Tooru Fukui, hailing from Hamura, Japan, is recognized for his invaluable contribution to the field of semiconductor technology. With a focused expertise in the inspection of semiconductor patterns, Fukui has made significant strides in enhancing the efficiency of defect detection in semiconductor memories. His innovative approach has garnered attention within the tech industry.

Latest Patents

Fukui holds a notable patent titled "Method and apparatus for the inspection of patterns." This invention addresses the inspection of defects in semiconductor memories by separating chip comparison from repetitive pattern comparison. This unique methodology allows both comparisons to be conducted in parallel during a single scanning process, providing a more streamlined and effective approach to semiconductor inspection.

Career Highlights

Tooru Fukui’s professional journey includes valuable tenures at prominent companies such as Hitachi, Ltd. and Hitachi Tokyo Electronics Co., Ltd. His experiences at these organizations have equipped him with a robust foundation in semiconductor technology and innovations, allowing him to contribute meaningfully to the advancements in this field.

Collaborations

Throughout his career, Fukui has collaborated with notable colleagues like Yuzo Taniguchi and Mikihito Saito. Their collective expertise and efforts have undoubtedly enriched the innovation landscape in semiconductor technologies, fostering a collaborative environment that encourages creativity and technical advancements.

Conclusion

Tooru Fukui stands out as a significant figure in the semiconductor sector, with his pioneering patent illustrating the impact of innovative methodologies on defect detection. His career, marked by associations with prominent companies and collaborations with other talented professionals, emphasizes the importance of teamwork in driving technological progress. As the semiconductor industry continues to evolve, the contributions of inventors like Fukui will remain vital in shaping its future.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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