This inventor holds 5 USPTO granted patents. Top assignee: Fei Comapny. Active years: 2021-2024.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2021-2024
Title: Innovations by Tomás Tůma
Introduction
Tomás Tůma is a notable inventor based in Brno, Czech Republic. He has made significant contributions to the field of charged particle microscopy, holding a total of 5 patents. His work focuses on innovative methods for examining samples and determining their composition.
Latest Patents
One of Tomás Tůma's latest patents is a method of examining a sample using a charged particle microscope. This invention involves providing a charged particle beam and scanning it over a sample at various locations. The emissions from the sample are detected, and spectral information is used to assign different phases to the sample. This method enhances the understanding of the sample's characteristics by establishing estimated phases based on previously assigned data.
Another significant patent is a method and system for determining sample composition from spectral data. This system utilizes a trained neural network to identify chemical elements in a sample based on spectral data acquired through charged particle microscopy. If the identified elements do not match the known composition, the neural network is retrained to improve accuracy. This innovative approach allows for better identification of chemical elements in various samples.
Career Highlights
Tomás Tůma is currently employed at FEI Company, where he continues to develop and refine his innovative techniques in microscopy. His work has contributed to advancements in the field, making significant impacts on how samples are analyzed and understood.
Collaborations
Tomás collaborates with talented individuals such as Jan Klusácek and Jirí Petrek. Their combined expertise fosters a creative environment that drives innovation in their projects.
Conclusion
Tomás Tůma's contributions to charged particle microscopy through his patents and collaborative efforts highlight his role as a leading inventor in the field. His innovative methods are paving the way for advancements in sample analysis and composition determination.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
