Tomonori Hanaya

Title: Tomonori Hanaya: Innovator in Sample Measuring Devices

Introduction

Tomonori Hanaya is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of sample measuring devices, holding a total of 4 patents. His work is characterized by innovative designs that enhance the efficiency and functionality of sample handling systems.

Latest Patents

One of Hanaya's latest patents is a sample measuring device that features an adapter attached to each sample storage unit in a rack. Each adapter includes a pair of arms with lower-end structural bodies. When a sample container is mounted on these bodies, an opening force is applied, causing the bodies to retreat horizontally. This mechanism allows the sample container to be transferred from the rack to a lifting mechanism. In the closed state, pressure applied to the sample container causes a stopper segment to lower, restricting the opening motion of the arms. Another patent describes a similar sample measuring device where each adapter on the rack includes an opening/closing mechanism. During conveyance, a guiding block interacts with the mechanism, facilitating the transfer of sample containers between storage units and lifting mechanisms.

Career Highlights

Tomonori Hanaya is currently employed at Hitachi, Ltd., where he continues to develop innovative solutions in the field of sample measurement. His work has been instrumental in advancing technologies that improve laboratory efficiency and accuracy.

Collaborations

Hanaya collaborates with talented coworkers, including Yujiro Akuta and Takahiro Yokoyama. Their combined expertise contributes to the success of their projects and the development of cutting-edge technologies.

Conclusion

Tomonori Hanaya is a distinguished inventor whose work in sample measuring devices has made a significant impact in the field. His innovative patents and collaborations with skilled professionals highlight his commitment to advancing technology.